AI Machine Vision Platform

The AI Machine Vision Platform is a zero-code, one-stop deep learning workstation provided free of charge for enterprises and non-professional algorithm users.

    One-Stop Algorithm Platform

    Zero-Code Workstation

    End-to-End One-Stop 
    Management

    Cost Reduction and 
    Efficiency Enhancement

    A zero-code visual AI training platform that enables enterprises and non-professional algorithm users to easily complete AI model training—significantly lowering the barrier to adopting AI technologies.
    The platform offers comprehensive, end-to-end AI image workflow management, covering project management, data management, data annotation, model management, model training, model testing, model deployment, and intelligent hardware device management.
    The platform helps enterprises rapidly deploy AI-powered vision technologies, delivering efficient AI image algorithm solutions and accelerating the adoption of AI in industrial production.
    一站式算法平台

    Surface Defect Detection

    Designed for detecting surface defects or imperfections across various products, helping reduce quality inspection costs while 
    improving inspection efficiency and accuracy.

    传动设备螺纹内毛刺检测
    轴承缺陷检测

    Stamped Product Defect 
    Detection

    Crankshaft Defect Detection

    Automotive Wheel Hub Inspection

    Missing Component Detection

    Pharmaceutical Inspection

    汽车轮毂检测
    冲压产品缺陷检测
    漏装检测
    传动设备螺纹内毛刺检测
    Internal Thread Burr Detection for Transmission Components

    OCR Character Recognition

    Designed for character detection and comparison across a wide range of products.

    拓印膜字符检测
    车辆VIN码识别
    缸体字符检测
    批号检测

    Rubbing Film Character 
    Inspection

    Engine Block Character 
    Inspection

    Batch Number Inspection

    Vehicle VIN Recognition

    Three-Stage Inspection 
    and Traceability

    漏装检测

    One-Stop Algorithm Platform

    Pre-trained Models for Industrial Applications

    Intelligent Hardware Management

    Intelligent Label Filtering

    Clear Definition of Defect Scale

    Intelligent Assisted Annotation

    Leveraging Fitow’s years of data accumulation in industrial defect inspection scenarios, the platform offers pre-trained models suitable for a wide range of industrial defect detection tasks.
    By utilizing object detection and instance segmentation models, the platform enables precise defect localization and multi-scale defect filtering.
    The platform provides assisted annotation based on pre-trained models, automatically identifying and labeling targets within images—significantly improving annotation efficiency and reducing manual labor costs.
    The platform supports intelligent label filtering by category, allowing users to screen annotated images efficiently, quickly identify and correct mislabeled data, and improve dataset quality and model training performance.
    The platform supports the registration and operation of a full range of NVIDIA edge computing products, intelligent cameras, and edge computing devices. Through model deployment, it enables integrated edge–cloud applications for intelligent image processing.

    Product Advantages

    • 机器视觉算法平台智能化标注
      机器视觉算法平台
      The platform provides intelligent annotation services with support for result validation and manual correction, allowing users to quickly review and refine automatically generated annotations. This approach significantly accelerates the annotation process while ensuring high labeling accuracy and quality.
    • 机器视觉算法平台数据管理

      1. Dataset

      1. Dataset

      1. Dataset

      1. Dataset

      1

      1

      2

      2

      3

      3

      Training Set 
      Version

      Training Set 
      Version

      Training Set 
      Version

      The platform provides comprehensive data management capabilities, enabling easy import of third-party datasets in COCO format. Within data management, users can create multiple folders under the same dataset and flexibly select subsets of data as training sets, allowing more efficient and organized data structuring.Each time a dataset is modified or updated, the platform automatically generates a new version and records detailed change logs and annotations, enabling full traceability of dataset evolution. This approach effectively addresses data drift across diverse application scenarios and supports precise AI model training.
    • 机器视觉算法平台图像筛选
      The platform supports intelligent image filtering by label category, allowing users to efficiently identify mislabeled data and quickly complete dataset cleaning—significantly improving data processing efficiency.
    • 机器视觉算法平台统计分析
      机器视觉算法平台分析
      机器视觉算法平台统计
      机器视觉算法平台统计分析
      The platform offers comprehensive data statistical analysis tools to help users thoroughly evaluate datasets before training begins. These analyses include label count statistics, class distribution analysis, annotation size distribution, and other multi-dimensional metrics—providing clear insights into data characteristics and distributions, and enabling effective dataset optimization to improve model accuracy and robustness.
    • 机器视觉算法平台实时监控
      机器视觉算法平台模型评估
      机器视觉算法平台监控图片
      The platform enables real-time monitoring and evaluation of model training progress and performance. Users can view key metrics such as model accuracy, training time, iteration steps, training loss curves, validation PR curves, and confusion matrices, providing intuitive insights into model convergence and training effectiveness.
    • 机器视觉算法平台版本管理
      机器视觉算法平台版本号
      The platform provides full lifecycle version management for critical AI assets, including datasets and models. It supports iterative optimization across multiple training versions, forming a closed-loop model iteration workflow while enabling efficient tracking and management of different model versions throughout production.

    Product Application Scenarios

    Automotive OEM

    汽车整车
    汽车零部件

    Automotive Components

    Pharmaceuticals

    医药

    Chemical Fiber

    医药

    化纺

    Semiconductors

    半导体

    General Industrial

    泛工业
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